Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Researchers have developed a laboratory earthquake model that connects the microscopic real contact area between fault surfaces to the possibility of earthquake occurrences. Published in the ...